Title: | Advanced mineral classification using automated feature analysis and spectrum imaging with state-of-the-art silicon drift detectors |
Author: | Salge, Tobias Patzschke, M. Neumann, Reiner Scheller, S. |
Keywords: | Advanced mineral classification Automated feature analysis Silicon |
Date of Public.: | 2012 |
Publisher: | PROCESS MINERALOGY, 12., 2012, Cape Town-South Africa. Proceedings [...] |
Appears in Collections: | Trabalhos de Congressos |
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