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Title: Advanced mineral classification using automated feature analysis and spectrum imaging with state-of-the-art silicon drift detectors
Author: Salge, Tobias
Patzschke, M.
Neumann, Reiner
Scheller, S.
Keywords: Advanced mineral classification
Automated feature analysis
Silicon
Date of Public.: 2012
Publisher: PROCESS MINERALOGY, 12., 2012, Cape Town-South Africa. Proceedings [...]
Appears in Collections:Trabalhos de Congressos



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