Result
| Title: | Advanced mineral classification using automated feature analysis and spectrum imaging with state-of-the-art silicon drift detectors |
| Author: | Salge, Tobias Patzschke, M. Neumann, Reiner Scheller, S. |
| Keywords: | Advanced mineral classification Automated feature analysis Silicon |
| Date of Public.: | 2012 |
| Publisher: | PROCESS MINERALOGY, 12., 2012, Cape Town-South Africa. Proceedings [...] |
| Appears in Collections: | Trabalhos de Congressos |
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