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Title: Advanced mineral classification using automated feature analysis and spectrum imaging with state-of-the-art silicon drift detectors
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dc.contributor.authorSalge, Tobias
dc.contributor.authorPatzschke, M.
dc.contributor.authorNeumann, Reiner
dc.contributor.authorScheller, S.
dc.date.accessioned2022-02-10T17:54:02Z
dc.date.available2022-02-10T17:54:02Z
dc.date.issued2012
dc.language.isoother
dc.publisherPROCESS MINERALOGY, 12., 2012, Cape Town-South Africa. Proceedings [...]
dc.subjectAdvanced mineral classification
dc.subjectAutomated feature analysis
dc.subjectSilicon
dc.titleAdvanced mineral classification using automated feature analysis and spectrum imaging with state-of-the-art silicon drift detectors
dc.typeOther
Appears in Collections:Trabalhos de Congressos

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