Title: | Advanced mineral classification using feature analysis and spectrum imaging with EDS |
Author: | Salge, Tobias Neumann, Reiner Andersson, C. Patzschke, M. |
Keywords: | Silicon drift detectors Scanning electron microscopy Discrimination of calcite Discrimination of fluorite |
Date of Public.: | 2013 |
Appears in Collections: | Trabalhos de Congressos |
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